cbcvebase.
CVE-2024-45573
published 2025-02-03

CVE-2024-45573: Memory corruption may occour while generating test pattern due to negative indexing of display ID.

PriorityP341high7.8CVSS 3.1
AVLACLPRLUINSUCHIHAH
EPSS
0.10%
0.9th percentile
Memory corruption may occour while generating test pattern due to negative indexing of display ID.

Affected

24 ranges
VendorProductVersion rangeFixed in
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
qualcomm_incsnapdragon
Stop checking back — get the weekly exploitation signal.

Every Monday: what got weaponized or added to CISA KEV in the last seven days — each CVE cross-linked to its PoC, Nuclei template, and detection rule. Free, one email a week, unsubscribe in one click.